基于LabVIEW视觉的IC插座插孔缺陷检测平台设计

doi:10.16039/j.cnki.cn22-1249.2023.05.009

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摘要

由于传统人工检测方法对集成电路（IC）插座插孔进行缺陷检测，容易产生误差率高和检测效率慢的问题，因此设计了基于LabVIEW视觉的IC插座插孔缺陷检测平台。该平台的工作流程为LabVIEW软件调用CCD相机采集IC插座图像，进行图像处理，并通过颗粒分析进行缺陷检测设计，同时利用LabVIEW软件进行程序设计和可视化页面设计。实验结果表明，该平台检测正确率高达96%以上，每秒平均能检测36个IC插座，能够满足实际工业生产的需求。

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	李汉雄
	孙明革

关键词: LabVIEW LabVIEW视觉 IC插座插孔缺陷检测平台

Abstract:

Since traditional manual inspection methods for defect detection of integrated circuit (IC) socket jacks are prone to the problems of high error rate and slow detection efficiency, a LabVIEW vision-based IC socket jack defect detection platform is designed. The workflow of this platform is that LabVIEW software calls the CCD camera to collect IC socket images, perform image processing, and defect detection design through particle analysis, while using LabVIEW software for programming and visualization page design. The experimental results show that the platform detects the correct rate up to 96% or more, and can detect 36 IC sockets per second on average, which can meet the needs of actual industrial production.

Key words: LabVIEW LabVIEW vision IC socket jack defect detection

出版日期: 2023-05-25 发布日期: 2023-05-25 整期出版日期: 2023-05-25

TP29

引用本文:

李汉雄, 孙明革. 基于LabVIEW视觉的IC插座插孔缺陷检测平台设计 [J]. 吉林化工学院学报, 2023, 40(5): 46-50.
LI Hanxiong, SUN Mingge. LabVIEW vision-based IC socket jack defect detection platform design . Journal of Jilin Institute of Chemical Technology, 2023, 40(5): 46-50.

链接本文:

https://xuebao.jlict.edu.cn/CN/10.16039/j.cnki.cn22-1249.2023.05.009 或 https://xuebao.jlict.edu.cn/CN/Y2023/V40/I5/46

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