Since traditional manual inspection methods for defect detection of integrated circuit (IC) socket jacks are prone to the problems of high error rate and slow detection efficiency, a LabVIEW vision-based IC socket jack defect detection platform is designed. The workflow of this platform is that LabVIEW software calls the CCD camera to collect IC socket images, perform image processing, and defect detection design through particle analysis, while using LabVIEW software for programming and visualization page design. The experimental results show that the platform detects the correct rate up to 96% or more, and can detect 36 IC sockets per second on average, which can meet the needs of actual industrial production.